Small‐angle x‐ray scattering from oriented ellipsoidal voids in pyrolytic graphite
نویسندگان
چکیده
منابع مشابه
UFM observation of lattice defects in highly oriented pyrolytic graphite
Ultrasonic force microscopy (UFM) can be used to image the distribution of elastic modulus up to several tens of GPa, which is not possible by the force modulation mode using a soft cantilever of spring constant less than 1 N m‘. It was shown that by careful design of a piezoelectric transducer, together with a sample with small friction force, deflection vibration of the cantilever without tor...
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Transients associated with partial discharges in voids can be described in terms of the charges induced on the terminal electrodes of the system. The relationship between the induced charge and the properties which are usually measured is discussed. The method is illustrated by applying it to a spheroidal void located in a simple disk-type GIS spacer. I N T R O D U C T I O N HE transients which...
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ژورنال
عنوان ژورنال: Journal of Applied Physics
سال: 1978
ISSN: 0021-8979,1089-7550
DOI: 10.1063/1.325177